In the rapid development of ion probes, it is impossible to explain or list all the different instruments. In a nutshell, it can be divided into the following categories. Non-imaging ion probe Application of ion probe instrument First, the metal sample Second, the semiconductor device Third, non-conductor samples
With different capacity of Lishida Dark Soy Sauce,our products are popular all over China and exported to America,Europe,Africa and so on.Also,we cooperate with well-known brands for OEM business.
Dark Soy Sauce Dark Soy Sauce,non GMO Soy Sauce,OEM Dark Soy Sauce KAIPING CITY LISHIDA FLAVOURING&FOOD CO.,LTD , https://www.lishidafood.com
The four classifications and applications of ion probe instruments: in terms of imaging technology, they can be divided into scanning ion microprobes and imaging ion probes. The former has a small ion beam spot diameter (φ ≤ 1 μm) and is scanned on the sample, similar to scanning electron microscopy (SEM) and scanning Auger microprobe (SAM), also known as ion microprobe. The latter is a large ion beam spot (φ ~ 300μm) and is stationary, while secondary ion optics scanning imaging, also called ion microscope, spatial resolution ~ 0.2μm.
2. Ion microscope
3. Scanning ion microprobe
4. Image dissecting ion probes (image dissecting ion probes)
Ion probes are suitable for many different types of samples. The following are some representative examples.
This is the ideal sample and will not be charged. It is proposed that the analysis area of ​​interest can be directly found by SEM. The use of profiled samples and scanning along the cross-section using a scanning ion probe is a useful technique that complements dynamic SIMS. It can be used for metal oxide growth, corrosion, welding, stress failure fracture and grain boundary segregation.
The doping profile and the layered structure are detected. With the development of very large scale integrated circuits, scanning ion probe analysis is becoming more and more important.
Polymer and glass products are typical insulating samples. To solve the charge problem for the child, the flame photometer has developed a micro-focus scanning atomic beam that produces high quality ion images of the insulating sample. However, when the lateral resolution needs to be better than 5 μm, the above source cannot meet the requirements. At this point, it is still necessary to use a focused micro-ion beam. In this respect, the ion image of the compound fly of the housefly has been successfully obtained. Another area of ​​application is composites, especially when studying the fracture interface of such materials.
We select non-GMO soybeans and other high quality ingredients to brew in the traditional process.We have passed the Quality Standard Certificate,ISO9001 Quality Management System Certificate,HACCP System Certificate and so on to maintain strict quality assurance.
We offer safe and great quality with favourable price,and welcome to contact us!
Classification and application of ion probe instruments
Generally, the ion beam spot is larger than 10 μm, which is called nonimaging macroprobes; the ion beam spot is less than 10 nm, called ion microbes.